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Energy-dispersive X-ray detector and counting circuit that achieve high resolution and high counting rate! X-ray diffraction and fluorescence X-ray analysis.
A comprehensive system of energy-dispersive X-ray detectors and counting circuits that achieves high energy resolution and high counting rates by minimizing thermal noise through Peltier element cooling and maximizing charge collection.
Event Detector System (Linked with Shock Testing Machine)
- In tests such as drop impact tests, where mechanical stress is applied at regular intervals, resistance value data is collected for 10 msec for each stress cycle (10,000 points at 1 μsec intervals). - In the standard configuration, it is possible to simultaneously collect, judge, and save data from up to 16 channels. - Instantaneous interruption detection and waveform information acquisition are executed simultaneously. - Collected list data and waveform data can also be analyzed using the included Viewer software. - Stress simulation services can also be proposed.
Event Detector System (Linked with Environmental Test Chamber)
- It is a system that can monitor the momentary disconnection of the conductive part with a resolution of 1μsec, in conjunction with the temperature cycle chamber. - It is utilized in connection reliability tests of semiconductor packages, among other applications.
